Jeol IB-09010CP Cross Section Polisher #60317
CEF(cu...
CEF(curtain effect free)特殊分析技術. ☑ 減少研磨液殘留 ☑ 減少刀痕 ☑ 保留結構最原始樣貌. CP是用離子束進行橫截面樣品製備的常用工具。 對於異質材料來 ... ,CP (Cross-section Poilsher) 橫截面離子束切割. Acceleration Voltage : 2 to 6 kV. Ion Beam Diameter : 500 µm (FWHM). Milling Rate : 1.3µm/min. Maximum ... , 離子束剖面研磨(Cross section polisher, CP),利用離子束切割方式,切削出樣品剖面,不同於一般的剖面研磨,離子束切割,可避免因研磨過程所 ..., CP can be used for 1mm size cross-section preparation of any material. It is ideal for material characteristics analysis (e.g. EDS, WDS, Auger ...,JEOL offers a Cooling Cross Section Polisher for preparation and polishing of materials that are sensitive to exposure to air or thermal damage, such as solder, ... ,A cross section at 90 degrees to the surface of a specimen (JEOL patent). The cross section polisher (CP), which is su...
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CEF(curtain effect free)特殊分析技術. ☑ 減少研磨液殘留 ☑ 減少刀痕 ☑ 保留結構最原始樣貌. CP是用離子束進行橫截面樣品製備的常用工具。 對於異質材料來 ... ,CP (Cross-section Poilsher) 橫截面離子束切割. Acceleration Voltage : 2 to 6 kV. Ion Beam Diameter : 500 µm (FWHM). Milling Rate : 1.3µm/min. Maximum ... , 離子束剖面研磨(Cross section polisher, CP),利用離子束切割方式,切削出樣品剖面,不同於一般的剖面研磨,離子束切割,可避免因研磨過程所 ..., CP can be used for 1mm size cross-section preparation of any material. It is ideal for material characteristics analysis (e.g. EDS, WDS, Auger ...,JEOL offers a Cooling Cross Section Polisher for preparation and polishing of materials that are sensitive to exposure to air or thermal damage, such as solder, ... ,A cross section at 90 degrees to the surface of a specimen (JEOL patent). The cross section polisher (CP), which is su...
#1 汎銓科技新研發CP(cross
CEF(curtain effect free)特殊分析技術. ☑ 減少研磨液殘留 ☑ 減少刀痕 ☑ 保留結構最原始樣貌. CP是用離子束進行橫截面樣品製備的常用工具。 對於異質材料來 ...
CEF(curtain effect free)特殊分析技術. ☑ 減少研磨液殘留 ☑ 減少刀痕 ☑ 保留結構最原始樣貌. CP是用離子束進行橫截面樣品製備的常用工具。 對於異質材料來 ...
#2 CP Corss
CP (Cross-section Poilsher) 橫截面離子束切割. Acceleration Voltage : 2 to 6 kV. Ion Beam Diameter : 500 µm (FWHM). Milling Rate : 1.3µm/min. Maximum ...
CP (Cross-section Poilsher) 橫截面離子束切割. Acceleration Voltage : 2 to 6 kV. Ion Beam Diameter : 500 µm (FWHM). Milling Rate : 1.3µm/min. Maximum ...
#4 Ion Beam Cross-section Polisher (CP)
CP can be used for 1mm size cross-section preparation of any material. It is ideal for material characteristics analysis (e.g. EDS, WDS, Auger ...
CP can be used for 1mm size cross-section preparation of any material. It is ideal for material characteristics analysis (e.g. EDS, WDS, Auger ...
#5 JEOL USA IB-09010CP Cross Section Polisher
JEOL offers a Cooling Cross Section Polisher for preparation and polishing of materials that are sensitive to exposure to air or thermal damage, such as solder, ...
JEOL offers a Cooling Cross Section Polisher for preparation and polishing of materials that are sensitive to exposure to air or thermal damage, such as solder, ...
#6 Cross Section Polisher
A cross section at 90 degrees to the surface of a specimen (JEOL patent). The cross section polisher (CP), which is supported by the patented technology ...
A cross section at 90 degrees to the surface of a specimen (JEOL patent). The cross section polisher (CP), which is supported by the patented technology ...
#7 Cross section polisher
A Cross Section Polisher (hereinafter, “CP”) is a device to prepare pristine cross sections of a specimen for a scanning electron microscope (SEM), electron ...
A Cross Section Polisher (hereinafter, “CP”) is a device to prepare pristine cross sections of a specimen for a scanning electron microscope (SEM), electron ...
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專家精算 減重方式CP值大解析
不論景氣好壞,國人的減重熱度都不會受到影響,對精打細算的小資族而言,減重的方式必須是能贏得健康美麗,同時還得兼顧荷包,才算是高「CP值」的聰明減重。面對各式各樣令人眼花繚亂的減重方法,到底要如...
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